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AFM (atomic force microscopy) technology was applied on C-S-H (calcium silicate hydrate phase) microstructure investigation.The topographies of hydrated C3S (Tricalcium silicate) samples were firstly acquired with AFM.Accordingly,C-S-H can be identified according its pattern.Then the hydrated pssortland cement samples at different curing time were scanned with AFM.The topographies and force displacement curve were acquired and its characters at different days were summarized and analyzed.These results are very meaningful for C-S-H microstructure further investigation and cement-base material macro scale properties improvement.

参考文献

[1] Cappella B.;Dietler G. .Force-distance curves by atomic force microscopy[J].Surface Science Reports,1999(1/3):1-104.
[2] HE Zhen,LIANG Wenquan,WANG Lei,WANG Jie.Synthesis of C_3S by Sol-Gel Technique and Its Features[J].武汉理工大学学报(材料科学版)(英文版),2010(01):138-141.
[3] Wang HY;Hu M;Liu N;Xia MF;Ke FJ;Bai YL .Multi-scale analysis of AFM tip and surface interactions[J].Chemical Engineering Science,2007(13):3589-3594.
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