采用回流焊技术制备AuSn20/Ni焊点,通过扫描电镜(SEM)和电子探针(EPMA)技术分析焊点的界面反应及退火过程中组织的演变,并探讨界面金属间化合物(IMC)的生长动力学.结果表明,在583 K钎焊后,AuSn20/Ni界面形成(Ni,Au)3Sn2IMC层,而且IMC层厚度l的变化随退火时间t的延长符合表达式l=k(t/t0)n.焊点分别在393、433和473 K下退火时,关系指数n分别为0.527、0.476和0.471,表明在低于液相线温度退火时,AuSn20/Ni界面IMC层的生长以体积扩散机制为主,且其体积扩散的预指数因子K0和激活焓QK分别为1.23×10?7 m2/s和81.8 kJ/mol.
The AuSn20/Ni joints were prepared by the reflow soldering technology and then annealed at solid-state temperature to form diffusion couples. The interfacial reactions and the growth kinetics of the intermetallic compounds (IMC) at the AuSn20/Ni soldering interface were investigated by scanning electron microscopy (SEM) and electron probe microanalysis (EPMA). The results show that, the (Ni,Au)3Sn2 phases are formed at the AuSn20/Ni interface after soldering at 583 K. The thicknesslof the IMC layer monotonically increases with increasing annealing timet according to the relationshipl=k(t/t0)n, where the exponentn is 0.527, 0.476 and 0.471 for 393, 433 and 473 K annealing, respectively. This indicates that the volume diffusion contributes to the growth of the IMC layer at the AuSn20/Ni interface at solid-sate temperature. The pre-exponential factorK0=1.23×10?7 m2/s and the activation enthalpyQK=81.8 kJ/mol are obtained from the results of the parabolic coefficientKby a least-squares method.
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