Measurement of the remnant magnetic-field in Lorentz mode using permalloy

金属学报(英文版), 2009, 22(6): 435-439. doi: 10.1016/S1006-7191(08)60120-9

^1, , ^2, , ^3, , ^4, , ^5,

1.Beijing Laboratory of Electron Microscopy, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China

2.Advanced Technology & Materials Co., Ltd., Beijing 100081, China

3.Beijing Laboratory of Electron Microscopy, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China

4.Beijing Laboratory of Electron Microscopy, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China

5.Beijing Laboratory of Electron Microscopy, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China

基金项目: 国家自然科学基金(10776037)

Measurement of the remnant magnetic-field in Lorentz mode using permalloy

Haihua LIU ^1, , Xiaokun DUAN ^2, , Renchao CHE ^3, , Zhifeng WANG ^4, , Xiaofeng DUAN ^5,

1.Beijing Laboratory of Electron Microscopy, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China

2.Advanced Technology & Materials Co., Ltd., Beijing 100081, China

3.Beijing Laboratory of Electron Microscopy, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China

4.Beijing Laboratory of Electron Microscopy, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China

5.Beijing Laboratory of Electron Microscopy, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China

Keywords： Lorentz electron microscopy

A novel method was reported to measure the remnant magnetic field in Lorentz mode in a FEI Tecnai F20 transmission electron microscope equipped with a Lorentz lens. The movement of the circle Bloch line of the cross-tie wall in Permalloy is used to measure the remnant magnetic field by tilting the specimen and adjusting the objective lens current. The remnant magnetic field is estimated to be about 17 Oe, in a direction opposite to that of the objective lens magnetic field. The remnant magnetic field can be compensated by adjusting the value of the objective lens current.

参考文献

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[2]	J.W. Lau;M.A. Schofield;Y. Zhu .A straightforward specimen holder modification for remnant magnetic-field measurement in TEM[J].Ultramicroscopy,2007(4/5):396-400.
[3]	H. Y. Wang;X. F. Dai;Y. G. Wang .In Situ Observation of Magnetic Domain Structure in Co_(50)Ni_(20)FeGa_(29) Alloy under the Applied Magnetic Field[J].Materials transactions,2007(8):2255-2257.
[4]	H.H. Liu;X.K. Duan;R.C. Che;Z.F. Wang;X.F. Duan .In situ investigation of the magnetic domain wall in Permalloy thin film by Lorentz electron microscopy[J].Materials Letters,2008(17/18):2654-2656.

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