采用拉曼光谱仪﹑透射电镜﹑俄歇能谱仪﹑X射线光电子能谱仪等研究在SiO2/Si基底上化学沉积的多壁碳纳米管( MWCNTs)经390℃的空气中热处理120 min前后与HCl溶液化学处理前后的结构变化情况. 拉曼光谱集中测试低频(250-300 cm-1 )带. 结果表明,经热处理和化学处理后,在250-300 cm-1形成的拉曼带在峰位和半宽几乎没变. 由透射电镜可知,小直径碳纳米管的内径值与拉曼光谱测试结果一致. 这些结果表明,低频带产生于小直径碳纳米管的内壁中碳原子的径向呼吸振动.
MWCNTs grown by chemical vapor deposition on SiO2/Si substrates were investigated by Raman spectroscopy, trans-mission electron microscopy ( TEM) , Auger spectroscopy, and X-ray photoelectron spectroscopy before and after an annealing at 390 ℃ for 120 min in air or chemical treatment with a HCl solution. The Raman spectroscopy was focused on the low-frequency (250-300 cm-1 ) band. It is found that the positions and full widths at half maximum of the peaks forming the 250-300 cm-1 Raman band change little with the annealing or chemical treatment. The measured inner diameters of small-diameter CNTs from TEM agree well with those from Raman spectroscopy. These indicate that the low-frequency band originates from the radial breathing oscilla-tions of carbon atoms in the inner walls of small-diameter MWCNTs.
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