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采用固态硫化法硫化铜锡锌(CZT)预制膜制备铜锌锡硫(Cu2 ZnSnS4,CZTS)薄膜,研究硫化时间对CZTS薄膜性能的影响.利用X射线衍射仪(XRD)和紫外拉曼光谱仪(Raman)分析薄膜的物相结构,通过X射线能谱仪(EDS)分析薄膜的化学组分,采用扫描电镜(SEM)观察薄膜的表面形貌,利用UV-Vis研究薄膜的光学特性.结果表明:随着硫化时间延长,Cu含量增加,Zn含量明显减少.硫化40min以上制备的薄膜出现导致禁带宽度减小的杂相SnS,Sn2S3和Cu2 SnS3.当硫化时间为20min时,样品为单相的CZTS薄膜,薄膜表面均匀平整,化学组分贫Cu富Sn,吸收系数达104 cm-1,禁带宽度Eg约为1.56eV.

参考文献

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