欢迎登录材料期刊网

材料期刊网

高级检索

与金属之间过高的接触电阻是影响碳纳米管在微纳电子器件中应用的关键因素之一,本文从形成机理和改善方法两个方面综述了近年来碳纳米管接触电阻的研究进展。介绍了利用第一性原理对碳纳米管与金属界面电子输运性能的理论研究,以及金属功函数对界面势垒调试作用的实验研究。研究表明金属与碳纳米管之间具有较弱的杂化作用和较长的接触长度时,接触电阻较小;金属与碳纳米管功函数越接近,势垒高度越低。阐述了超声焊接技术、高温退火法、金属沉积法、局部焦耳热法等常用降低碳纳米管接触电阻方法的作用机理,并分析了这些方法对器件性能的改善作用。其中局部焦耳热法操作简单、易于自动化、对器件损害小、成本低,是目前比较理想的降低碳纳米管接触电阻的方法。

The high contact resistance of carbon nanotubes ( CNTs) with metal is one key factor that retards the application of CNTs in micro-and nano-electronics devices. This paper reviews recent research progress on the contact resistance of CNTs from two aspects, they are the formation and improvement of the CNT’ s contact resistance. Theoretical studies of the contact resistance of CNTs using the first principles and experimental investigations into the effect of metal work function on the interface barrier were introduced. Results show that the contact resistance is low when there is a weak hybrid effect and large contact length between the metal and CNTs, and the closer the work function of the metal to that of the CNTs, the lower the barrier height. The commonly used methods for improving the contact resistance of CNTs, including ultrasonic nanowelding, high temperature annealing, metal deposition, and local Joule heating were presented, and the improvement of device performance using these methods was analysed. Among these methods, local Joule heat-ing is more ideal at present time since it is with the advantages of simple operation, high degree of automation, less device damage, and low cost.

参考文献

[1] Phaedon Avouris.Molecular electronics with carbon nanotubes[J].Accounts of Chemical Research,200212(12):1026-1034.
[2] 朱长纯;袁寿财;李玉魁.碳纳米管及其应用[J].微纳电子技术,2002(8):1-6,25.
[3] Fu, WY;Xu, Z;Bai, XD;Gu, CZ;Wang, EG.Intrinsic Memory Function of Carbon Nanotube-based Ferroelectric Field-Effect Transistor[J].Nano letters,20093(3):921-925.
[4] Stampfer C;Helbling T;Obergfell D;Schoberle B;Tripp MK;Jungen A;Roth S;Bright VM;Hierold C.Fabrication of single-walled carbon-nanotube-based pressure sensors[J].Nano letters,20062(2):233-237.
[5] An, L.;Friedrich, C.R..Measurement of contact resistance of multiwall carbon nanotubes by electrical contact using a focused ion beam[J].Nuclear Instruments and Methods in Physics Research, Section B. Beam Interactions with Materials and Atoms,2012:169-172.
[6] Yuki Matsuda;Wei-Qiao Deng;William A. Goddard III.Contact Resistance Properties between Nanotubes and Various Metals from Quantum Mechanics[J].The journal of physical chemistry, C. Nanomaterials and interfaces,200729(29):11113-11116.
[7] Nemec N;Tomanek D;Cuniberti G.Contact dependence of carrier injection in carbon nanotubes: An ab initio study[J].Physical review letters,20067(7):6802-1-6802-4-0.
[8] Zhizhou Yu;L. Z. Sun;X. L. Wei;J. X. Zhong.Novel transport properties of gold-single wall carbon nanotubes composite contacts[J].Journal of Applied Physics,20106(6):064318-1-064318-5.
[9] Smolyanitsky, A.;Tewary, V.K..Simulation of lattice strain due to a CNT-metal interface[J].Nanotechnology,20118(8):085703-1-085703-4.
[10] 谭苗苗;张子义.面向NEMS器件的碳纳米管与金属电极电接触研究[J].功能材料与器件学报,2012(5):417-420.
[11] HosungKang;Beibei Wang;Seunghyun Hong.Dielectrophoretic separation of metallic arc-discharge single-walled carbon nanotubes in a microfluidic channel[J].Synthetic Metals,2013:23-28.
[12] Seong Chu Lim;Jin Ho Jang;Dong Jae Bae;Gang Hee Han;Sunwoo Lee;In-Seok Yeo;Young Hee Lee.Contact resistance between metal and carbon nanotube interconnects: Effect of work function and wettability[J].Applied physics letters,200926(26):264103-1-264103-3.
[13] 张芸秋;梁勇明;周建新.石墨烯掺杂的研究进展[J].化学学报,2014(3):367-377.
[14] Ali Javey;Jing Guo;Damon B. Farmer;Qian Wang;Dunwei Wang;Roy G. Gordon;Mark Lundstrom;Hongjie Dai.Carbon Nanotube Field-Effect Transistors with Integrated Ohmic Contacts and High- Gate Dielectrics[J].Nano letters,20043(3):447-450.
[15] Xiaodong Cui;Marcus Freitag;Richard Martel;Louis Brus;Phaedon Avouris.Controlling Energy-Level Alignments at Carbon Nanotube/Au Contacts[J].Nano letters,20036(6):783-787.
[16] 李萍剑;张文静;张琦锋;吴锦雷.接触电极的功函数对基于碳纳米管构建的场效应管的影响[J].物理学报,2006(10):5460-5465.
[17] Yosuke Nosho;Yutaka Ohno;Shigeru Kishimoto;Takashi Mizutani.n-type carbon nanotube field-effect transistors fabricated by using Ca contact electrodes[J].Applied physics letters,20057(7):073105-1-073105-3-0.
[18] Changxin Chen;Liyue Liu;Yang Lu.A method for creating reliable and low-resistance contacts between carbon nanotubes and microelectrodes[J].Carbon: An International Journal Sponsored by the American Carbon Society,20072(2):436-442.
[19] 赵波;齐红霞.焊接时间对碳纳米管-Ti焊接效果的影响[J].郑州大学学报(理学版),2012(2):48-51.
[20] Changxin Chen;Lijun Yan;Eric Siu-Wai Kong.Ultrasonic nanowelding of carbon nanotubes to metal electrodes[J].Nanotechnology,20069(9):2192-2197.
[21] Changxin Chen;Dong Xu;Eric Siu-Wai Kong;Yafei Zhang.Multichannel Carbon-Nanotube FETs and Complementary Logic Gates With[J].IEEE Electron Device Letters,200610(10):852-855.
[22] 陈长鑫;金铁凝;张亚非.碳纳米管/金属接触改善方法的研究进展[J].无机材料学报,2012(5):449-457.
[23] Lee JO.;Kim JJ.;Kim J.;Park JW.;Yoo KH.;Park C..Formation of low-resistance ohmic contacts between carbon nanotube and metal electrodes by a rapid thermal annealing method[J].Journal of Physics, D. Applied Physics: A Europhysics Journal,200016(16):1953-1956.
[24] 谭苗苗;叶雄英;王晓浩;周兆英.利用退火的碳纳米管与金属接触特性的改善[J].功能材料与器件学报,2008(1):227-230.
[25] Huang, L;Chor, EF;Wu, Y;Guo, Z.Investigations of niobium carbide contact for carbon-nanotube-based devices[J].Nanotechnology,20109(9):095201:1-095201:7.
[26] M. Liebau;E. Unger;G. S. Duesberg;A. P. Graham;R. Seidel;F. Kreupl;W. Hoenlekin.Contact improvement of carbon nanotubes via electroless nickel deposition[J].Applied physics, A. Materials science & processing,20036(6):731-734.
[27] Dorte Norgaard Madsen;Kristian Molhave;Ramona Mateiu;Anne Marie Rasmussen;Michael Brorson;Claus J. H. Jacobsen;Peter Boggild.Soldering of Nanotubes onto Microelectrodes[J].Nano letters,20031(1):47-49.
[28] Dong LF;Youkey S;Bush J;Jiao J;Dubin VM;Chebiam RV.Effects of local Joule heating on the reduction of contact resistance between carbon nanotubes and metal electrodes[J].Journal of Applied Physics,20072(2):24320-1-24320-7-0.
[29] 韩子旭;安立宝;张鹏.通电降低碳纳米管接触电阻的正交试验研究[J].化工新型材料,2015(11):126-128,131.
[30] 孟岭超;曾永彬;曲宁松;朱荻.碳纳米管工具电极的导电性能[J].光学精密工程,2014(3):679-686.
[31] 刘璇;刘泽;孙璞;吴莹;王亚荣.基于碳纳米管的纳米连接技术研究进展[J].化学通报(印刷版),2014(3):204-208.
[32] Chai, Y.;Hazeghi, A.;Takei, K.;Chen, H.-Y.;Chan, P. C. H.;Javey, A.;Wong, H.-S. P..Low-Resistance Electrical Contact to Carbon Nanotubes With Graphitic Interfacial Layer[J].IEEE Transactions on Electron Devices,20121(1):12-19.
[33] Rykaczewski, K;Henry, MR;Kim, SK;Fedorov, AG;Kulkarni, D;Singamaneni, S;Tsukruk, VV.The effect of the geometry and material properties of a carbon joint produced by electron beam induced deposition on the electrical resistance of a multiwalled carbon nanotube-to-metal contact interface[J].Nanotechnology,20103(3):035202:1-035202:12.
[34] Bachtold A.;Tarrier C.;Strunk C.;Schonenberger C.;Salvetat JP.;Bonard JM.;Forro L.;Henny M..Contacting carbon nanotubes selectively with low-ohmic contacts for four-probe electric measurements[J].Applied physics letters,19982(2):274-276.
[35] Ando A;Shimizu T;Abe H;Nakayama Y;Tokumoto H.Improvement of electrical contact at carbon nanotube/Pt by selective electron irradiation[J].Physica, E. Low-dimensional systems & nanostructures,20041/2(1/2):6-9.
上一张 下一张
上一张 下一张
计量
  • 下载量()
  • 访问量()
文章评分
  • 您的评分:
  • 1
    0%
  • 2
    0%
  • 3
    0%
  • 4
    0%
  • 5
    0%