利用钯膜分离氢是高纯或超纯氢气生产的主要方式,然而,钯膜表面缺陷是影响氢分离纯度的主要因素.本文选择NaA分子筛和γ-Al2O3两种缺陷填充材料对初镀后的钯膜表面缺陷进行修饰,发现两种材料修饰后钯膜透氮量分别下降了57和2倍,NaA分子筛材料修饰后钯膜的透氮量为未修饰钯膜的1/2 500.经过补镀和活化后,在相同钯膜厚度(2.5μm)条件下,3种钯膜透氮量分别为1.91×10-3、6.12×10-4和4.89×10-3m3/(h·m2·MPa).不同修饰材料修饰的钯膜的氢氮分离因子顺序为NaA分子筛＞γ-Al2O3＞无修饰,说明通过修饰钯膜缺陷的方法可提高钯膜的氢分离选择性,且用NaA分子筛材料要优于γ-Al2 O3材料,因为NaA分子筛在缺陷中可根据缺陷形状原位生长,更能有效填补缺陷.NaA分子筛材料修饰后的钯膜经过20次300～400℃以及0.1～1.0 MPa的温度和压力循环仍保持性能不变,具有较高的稳定性.
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