为研究高压并联电抗器匝间绝缘纸的击穿特性，搭建测试试验平台，测试匝间绝缘纸的击穿电压，同时研究温度对匝间绝缘纸击穿特性的影响。采用威布尔分布分析击穿电压数据，获取了匝间绝缘纸在不同温度下的失效规律。结果表明：温度升高降低了绝缘纸的击穿电压，且在较高温度下，击穿电压下降更快。此外，高温下测试击穿电压的数据分散性较大，增大了绝缘失效概率。
In order to investigate the breakdown voltage characteristics of turn-to-turn insulation paper for reactor, a test platform was established, and the breakdown voltage of turn-to-turn insulation paper was tested. The influence of temperature on the breakdown voltage characteristics of the turn-to-turn insulation paper was studied. The breakdown voltage data was analyzed by Weibull distribution, and the short-time failure mechanism under different temperatures was obtained. The results show that the breakdown voltage reduces with the increase of temperature, and the breakdown voltage decreases faster at higher temperatures. The dispersity of breakdown voltage data becomes bigger at higher temperatures, so the possibility of insulation failure increases.
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