采用实验和有限元模拟,研究了底充胶分层和SnPb焊点的可靠性.结果表明,底充胶分层易发生在芯片/底充胶界面边缘处;当底充胶与芯片粘合强度较弱时,底充胶的早期分层是焊点中裂纹萌生扩展从而导致失效的直接原因;当底充胶与芯片粘合强度较强时,分层可以削弱底充胶对焊点的机械耦合作用,从而影响焊点的热循环寿命,此时,焊点热疲劳裂纹是焊点失效的直接原因.
参考文献
[1] | Suhir E. J Elect Packag, 1998; 120:1 |
[2] | Suryanarayana D, Hsiao R, Gall T P, McCreary J M.IEEE Trans Compon Hybrids Manuf Technol, 1991; 14:218 |
[3] | Doi K, Hirano N, Okada T. Hiruta Y, Sudo T. Int J MicrElect Packag, 1996; 19:231 |
[4] | Gektin V, Cohen A B, Ames J. IEEE Trans Compon Packag Manuf Technol, 1997; 20:317 |
[5] | Nysather J B, Lundstrom P, Liu J. IEEE Trans Compon Packag Manuf Technol, 1998; 21:281 |
[6] | Madenci E, Shkarayev S, Mahajan R. J Elect Packag,1998; 120:336 |
[7] | O'Malley G, Giesler J, Machuge S. IEEE Trans Compon Pzckag Manuf Technol, 1994; 17B: 245 |
[8] | Doi H, Kawano K, Yasukawa A, Sato T. J Elect Packag,1998; 120:322 |
[9] | Gamota D, Melton C. Adv Microelectron, 1997;July/August: 22 |
[10] | Rosson J M, Clawson R A, Ihms D W. Adv Packag, 1999;January: 48 |
[11] | Zhu Q N, Wang G Z, Cheng Z N, Luo L. Acta Metall Sin,2000; 36:93(朱奇农,王国忠,程兆年,罗乐.金属学报,2000;36:93) |
[12] | Yeung T S, Yuen M M F. Sen Mod Simu Emer Electr Packag, 1996; 17:101 |
[13] | Tran S K, Questad D L, Sammakia B G. IEEE Trans Compon Packag Manuf Technol, 1999; 22:519 |
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