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采用实验和有限元模拟,研究了底充胶分层和SnPb焊点的可靠性.结果表明,底充胶分层易发生在芯片/底充胶界面边缘处;当底充胶与芯片粘合强度较弱时,底充胶的早期分层是焊点中裂纹萌生扩展从而导致失效的直接原因;当底充胶与芯片粘合强度较强时,分层可以削弱底充胶对焊点的机械耦合作用,从而影响焊点的热循环寿命,此时,焊点热疲劳裂纹是焊点失效的直接原因.

参考文献

[1] Suhir E. J Elect Packag, 1998; 120:1
[2] Suryanarayana D, Hsiao R, Gall T P, McCreary J M.IEEE Trans Compon Hybrids Manuf Technol, 1991; 14:218
[3] Doi K, Hirano N, Okada T. Hiruta Y, Sudo T. Int J MicrElect Packag, 1996; 19:231
[4] Gektin V, Cohen A B, Ames J. IEEE Trans Compon Packag Manuf Technol, 1997; 20:317
[5] Nysather J B, Lundstrom P, Liu J. IEEE Trans Compon Packag Manuf Technol, 1998; 21:281
[6] Madenci E, Shkarayev S, Mahajan R. J Elect Packag,1998; 120:336
[7] O'Malley G, Giesler J, Machuge S. IEEE Trans Compon Pzckag Manuf Technol, 1994; 17B: 245
[8] Doi H, Kawano K, Yasukawa A, Sato T. J Elect Packag,1998; 120:322
[9] Gamota D, Melton C. Adv Microelectron, 1997;July/August: 22
[10] Rosson J M, Clawson R A, Ihms D W. Adv Packag, 1999;January: 48
[11] Zhu Q N, Wang G Z, Cheng Z N, Luo L. Acta Metall Sin,2000; 36:93(朱奇农,王国忠,程兆年,罗乐.金属学报,2000;36:93)
[12] Yeung T S, Yuen M M F. Sen Mod Simu Emer Electr Packag, 1996; 17:101
[13] Tran S K, Questad D L, Sammakia B G. IEEE Trans Compon Packag Manuf Technol, 1999; 22:519
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