用磁控溅射方法制备了Ni80Co20/M(M=Co,Cr,Ag)多层膜样品系列,Co,Cr,Ag杂质层的标称厚度为0.1 nm,研究了界面散射对多层膜的磁及输运性质的影响.零场电阻率ρ的测量结果表明,对含Cr样品,p随杂质层间距L的依赖关系能较好的用Fuchs-Sondheimer(F-S)理论描述.而对含Co和Ag样品,ρ随L的依赖关系在L小于15 nm时开始偏离F-S理论.磁电阻测量表明,含Cr和Ag样品,各向异性磁电阻△ρ在L＜15 nm时随L的减小陡然下降.对含磁性Co元素的样品,其△p值在L＞15 nm时高于Ni80Co20单层薄膜的△ρ值;在L＜15 nm时△p值随L呈现振荡变化的趋势.磁性测量表明,三个系列样品的矫顽力Hc在L＜15 nm时都随L近似直线上升,在L＞15 nm后趋于饱和;经400℃真空退火后Hc都显著下降.
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