采用电子能量损失谱(EELS)研究了不同商用钢铁材料的晶界,计算了晶界处和晶粒内铁原子的3d电子占据态密度,并将其和晶界性质以及材料的宏观断裂性能相联系.结果表明:当样品晶界处铁原子的3d电子占据态密度高于晶粒内时,晶界结合强度低于晶内,晶界表现出脆性,材料的冲击断裂方式主要为脆性的沿晶断裂;反之,如果晶界处铁原子的3d电子占有态密度与基体没有明显的差异,则晶界结合强度与晶内相当,晶界表现出韧性,材料的断裂方式主要为韧性的穿晶断裂.
参考文献
| [1] | Spence J C H. Mater Sci Eng, 1999; 26R: 1 |
| [2] | Zhu J, Ye H Q, Wang R H, Wen S L, Kang Z C. Analytical Electron Microscopy with High Space Resolution. Beijing:Science Press, 1998:277(朱静,叶恒强,王仁卉,温树林,康振川.高空间分辨分析电子显微学.北京:科学出版社,1998:277) |
| [3] | Egerton R F. Electron Energy-loss Spectroscopy in the Electron Microscope. 2nd ed., New York: Plenum Press,1996:301 |
| [4] | Titchmarsh J M. Ultramicroscopy, 1999; 78:241 |
| [5] | Kiguchi M, Goto T, Saiki K, Sasaki T, Iwasawa Y, Koma A. Surf Sci, 2002; 512:97 |
| [6] | Pantel R, Wehbe-Alause H, Jullian S, Kwakman L F T.Microelectr Eng, 2002; 64:91 |
| [7] | Wang Z L, Bentley J, Evans N D. Micron, 2000; 31:355 |
| [8] | Yu-Zhang K, Imhoff D, Leprince-Wang Y, Roy E, Zhou S M, Chien C L. Acta Mater, 2003; 51:1157 |
| [9] | Wang Z L, Yin J S, Jiang Y D. Micron, 2000; 31:571 |
| [10] | Pearson D H, Ahn C C, Fultz B. Phys Rev, 1993; 47B:8471 |
| [11] | Pearson D H, Ahn C C, Fultz B. Phys Rev, 1994; 50B:12969 |
| [12] | Muller D A, Subramanian S, Batson P E, Sass S L, Silcox J. Phys Rev Lett, 1995; 75:4744 |
| [13] | Muller D A. Subramanian S, Batson P E, Silcox J, Sass S L. Acta Mater, 1996; 44:1637 |
| [14] | Zhang X Z, Ma Y, Wang M Q, Brown L M, Zhang L N.ISIJ Int, 2003; 143:671 |
| [15] | Ozkaya D, Yuan J, Brown L M, Flewitt P E J. J Microscopy-Oxford, 1995; 180:300 |
| [16] | Ozkaya D, Yuan J, Brown L M. Inst Phys Conf Ser, 1995;147:345 |
| [17] | Geng W T, Freeman A J, Wu R, Olson G B. Phys Rev,2000; 62B: 6208 |
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