用诱导型等离子体辅助磁控溅射装置在Si(100)表面低温沉积TiN膜,研究了高密度低能量(≈20 eV)离子束辅照对溅射镀TiN膜生长、结构和性能的影响.结果表明,高密度低能离子束辅照会改变TiN膜的择优生长方向并使薄膜致密化.即使沉积温度低于150℃,当入射基板离子数和Ti原子数的比值Ji/JTi≥4.7时,沉积的TiN膜仍可具有完全的(200)面择优生长,薄膜微观结构致密,硬度达到25 GPa,残余压应力小.
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