利用数值模拟与正交实验相结合的方法,研究了两段式无缝软接触结晶器壁厚(d)、结晶器上半段电阻率(ρ)、电源频率(f)、线圈电流强度(I)对结晶器透磁效果的影响规律.结果表明:结晶器内部磁感应强度(B)随f和d的增大而减小,随I和ρ的增大而增强.各因素对磁场影响的顺序依次为f,ρ,I,d.通过无量纲分析确定了两段式结晶器内弯月面处B与d,ρ,f,I之间的定量关系为B/(μ0 I/d)=4.36×109(ρ/I f)0.89.最后,确定了两段式结晶器应用于软接触技术最佳的实验条件为:d=5 mm,ρ=8.8×10-7 Ω·m,I=2000 A,f=2500 Hz.
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