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利用电子显微分析技术对高Co含量的室温铁磁性半导体Zn1-xCoxO1-δ进行了微观表征,证明了氧含量是决定Zn1-xCoxO1-δ薄膜微观结构和磁性能的重要因素.在缺氧环境下,薄膜由含有大量氧缺位的纤锌矿结构的Zn1-xCoxO1-δ纳米晶(直径约5 nm)和填充其间的Zn-Co-O非晶相组成,两相对薄膜宏观磁性均有贡献;在富氧的环境下,非晶Zn-Co-O相消失,出现了CoO反铁磁相,纤锌矿结构Zn1-xCoxO1-δ中的氧缺位大量减少,晶粒长大到10-20 nm,室温铁磁性逐渐减弱,直至消失.

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