针形铁黄纳米粒子表面包覆无机物如Si、Co等氧化物形成复合纳米粒子,是改善金属磁性记录粉性能的重要方式.采用ICP,TEM,XPS方法研究复合纳米粒子的表面性质,结果表明包硅复合粒子的表面形成均匀、致密的SiO2薄膜,表面层与基体表面间的界面结构类似异质结,导致粒子的XPS谱图中Fe2p谱峰发生2.7eV的化学位移;而包钴复合粒子由于钴在铁黄表面的吸附发生在部分晶面上而无法形成均匀、致密的薄膜,XPS谱图主要发生因表面荷电而导致的物理位移.
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