测试了PMNT 68/32{110}cub切型单晶的介电、压电性能和电滞回线,发现单晶铁电性能与所施加的极化电场及单晶中PbTiO3含量的变化密切相关.研究结果表明,相结构的变化是引起铁电性能变化的主要原因,即在<110>取向施加电场诱导出来的正交相是本征亚稳的,它的稳定性不仅取决于所施加的极化电场大小,而且与单晶中PbTiO3含量的变化密切相关.
参考文献
| [1] | Kuwata J, Uchino K, Nomura S. Ferroeleetrics, 1981, 37: 579-582. |
| [2] | Park S E, Shrout T R. IEEE Trans. Ultrason. Ferroelectr. ε Freq. Control., 1997, 44: 1140-1147. |
| [3] | Kuwata J, Uchino K, Nomura S. Jpn. J. Appl. Phys., 1982, 21: 1298-1302. |
| [4] | Xu G, Luo H, Wang P, et al. Chin. Sci. Bull., 2000, 45 (6): 491-495. |
| [5] | Jaffe B, Jaffe H, Cook W R. Piezoelectric Ceramics, London: Academic Press, 1971. |
| [6] | Fu Huaxiang, Cohen Ronald E. Nature, 2000, 403: 281-283. |
| [7] | Xu G, Luo H, Xu H, et al. Phys. Rev. B., 2001, 64: 020102-1-020102-3. |
| [8] | Ye Z G, Noheda B, Dong M, et al. Phys. Rev. B., 2001, 64: 184114. |
| [9] | Guo Yiping, Luo Haosu, He Tianhou, et al. Jpn. J. Appl Phys., 2002, 43: 1451-1453. |
| [10] | Lu Yu, Jeong D Y, Cheng Z Y, et al. Appl. Phys. Lett., 2001, 78: 3109-3111. |
| [11] | Noheda B, Cox D E, Shirane G, et al. Phys. Rev. Lett., 1999, 74: 2059-2061. |
| [12] | Noheda B, Cox D E, Shirane G, et al. Phys. Rev. Lett., 2001, 86: 3891-3894. |
| [13] | Luo H, Xu G, Wang P, et al. Jpn. J. Appl. Phys., 2000, 39: 5581-5585. |
| [14] | Viehland D, Powers J, Cross L, et al. Appl. Phys. Lett., 2001, 78: 3508-3510. |
| [15] | Ye Z G, Dong M. J. Appl. Phys., 2000, 87 (5): 2312-2319. |
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