欢迎登录材料期刊网

材料期刊网

高级检索

数值模拟了C-H-O和C-H-N体系的气相化学,构建了含氧和含氮气源化学气相沉积金刚石膜的三元相图,探讨了加氧和加氮影响金刚石膜生长的途径.结果表明,甲基是金刚石生长主要的前驱基团,乙炔导致非金刚石碳沉积,原子氢刻蚀非金刚石碳.通过气相反应改变这些基团的浓度是加氧的一个重要作用途径,而加氮在改变这些基团浓度的同时,CN等含氮基团还强烈地参与了金刚石膜成核和生长的表面过程.

参考文献

[1] Lee S T, Lin Z D, Jiang X. Mat. Sci. Eng. R, 1999, 25 (4): 123-154.
[2] Li D M, Hernberg R, Mantyla T. Diamond Relat. Mater, 1998, 7: 188-192.
[3] Bachmann P K, Leers D, Lydtin H. Diamond Relat. Mater, 1991, 1:1-12 and references therein.
[4] 李灿华,廖源,常超,等(LI Can-Hua, et al).无机材料学报(Journal of Inorganic Materials), 2001, 16(1): 81-86.
[5] Cassdiy W D, Evans E A, Wang Y, et al, Mat. Res. Soc. Symp. Proc, 1994, 339: 285-290.
[6] Marinelli M, Milani E, Montuori M, et al, J. Appl. Phys, 1994, 76 (10): 5702.
[7] Bachmann P K, Hagemann H J, Lade H, et al, Proceedings of the NIRIM International Symposium onAdvanced Materials 94. 115-120.
[8] Ford I J. J. Phys. D: Appl. Phys, 1996, 29: 2229-2234.
[9] Wang J T, Zhang D W, Ding S J, et al, Calphad, 2000, 24 (4): 427-434.
[10] 万永中,张志明,沈荷生,等(WAN Yong-Zhong, et al).无机材料学报(Journal of Inorganic Materials), 1999,14 (6): 840-846.
[11] Smith G P, Golden D M, Frenklach M, et al, GRI-Mech3.0.
[12] 戚学贵,常超,陈则韶,等(QIi Xue-Gui, et al).无机材料学报(Journal of Inorganic Materials), 2003, 18(1): 200-206.
[13] Lee S S, Minsek D W, Vestyck D J, et al, Science, 1994, 263: 1596-1598.
[14] Chu C J, DEvelyn M P, Hauge R H, et al, J. Appl. Phys, 1991, 70 (3): 1695-1705.
[15] 刘靖尧,丁益宏,刘波,等(LIU Jing-Yao, et al).高等学校化学学报(Chem. J. Chin. Univ.), 2000, 21 (3):444-447.
[16] McMaster M C, Hsu W L, Coltrin M E, et al, J. Appl. Phys, 1994, 76 (11): 7567-7577.
[17] Tsang R S, Rego C A, May P W, et al, Diamond Relat. Mater, 1997, 6: 247-254.
[18] Zhang G F, Geng D S, Yang Z J. Surf. Coat. Tech, 1999, 122: 268-272.
[19] Zhou D, Krauss A R, Qin L C, et al, J. Appl. Phys, 1997, 82 (9): 4546-4550.
[20] Xu N S, Chen J, Deng S Z, et al, J. Phys. D: Appl. Phys, 2000, 33: 1572-1575.
[21] Musale D V, Sainkar S R, Kshirsagar S T. Diamond Relat. Mater, 2002, 11: 75-86.
[22] Zhang Q, Yoon S F, Ahn J, et al, Microelectr. J, 1998, 29: 875-879.
[23] Badzian A, Badzian T, Lee S T. Appl. Phys. Lett, 1993, 62 (26): 3432-3434.
[24] Sowers A T, Ward B L, English S L, et al, J. Appl. Phys, 1999, 86 (7): 3973-3982.
[25] Mitsuda Y, Kobayashi K. Thin Solid Films, 1999, 345: 55-59.
[26] Clay K J, Speakman S P, Amaratunga G A J, et al, J. Appl. Phys, 1996, 79 (9): 7227-7233.
[27] Afzal A, Rego C A, Ahmed W, et al, Diamond Relat. Mater, 1998, 7: 1033-1038.
[28] Haubner R, Bohr S, Lux B. Diamond Relat. Mater, 1999, 8: 171-178.
[29] Vandevelde T, Nesladek M, Quaeyhaegens C, et al, Thin Solid Films, 1997, 308-309: 154-158.
[30] Elmazria O, Bougdira J, Chatei H, et al, Thin Solid Films, 2000, 374: 27-33.
[31] Ayres V M, Bieler T R, Kanatzidis M G, et al, Diamond Relat. Mater, 2000, 9: 236-240.
[32] Bohr S, Haubner R, Lux B. Appl. Phys. Lett, 1996, 68 (8): 1075-1077.
[33] Shang N G, Lee C S, Lin Z D, et al, Diamond Relat. Mater, 2000, 9: 1388-1392.
[34] Yu Z, Karlsson U, Flodstrom A. Thin Solid Films, 1999, 342: 74-82.
上一张 下一张
上一张 下一张
计量
  • 下载量()
  • 访问量()
文章评分
  • 您的评分:
  • 1
    0%
  • 2
    0%
  • 3
    0%
  • 4
    0%
  • 5
    0%