用衰减全反射红外光谱(FTIR-ATR)技术研究了纳米SiO2粒子在紫外光固化复合涂层中的迁移现象,并对影响纳米SiO2粒子在涂层中分布梯度的因素进行了半定量分析.研究结果表明,纳米SiO2粒子在光固化过程中向涂层接触空气的表面迁移,在表面层富集.当纳米SiO2粒子含量较高、分子量较小、接枝率较高,或者在极性较大的基体树脂中时,迁移较快,分布梯度较大.
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