设计并加工了在材料试验机上使用的高压扭转夹持装置,并用装置获得了不同扭转变形量的纯铜试样.使用电子背散射衍射技术测量了处理后试样晶粒尺寸沿径向的分布.对比分析了晶粒细化程度和应变量的关系,提出了一个描述晶粒细化的简单剪切球模型.结果表明,晶粒细化程度随着应变量的增大而增强,平均晶粒尺寸为原始平均尺寸的1/50.当剪切应变小于10时,晶粒尺寸随着剪切应变的增大迅速变小;当剪切应变大于10时,晶粒尺寸的变化趋于缓慢,晶粒细化程度与Stuwe等效应变之间有幂函数关系.依据简单剪切球形晶粒的模型,得到了晶粒细化程度随剪切应变增大而增强的规律,并与实验数据的变化趋势一致.
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