采用电化学技术(动电位极化曲线,自腐蚀电位,EIS,Mott-Schottcky(MS)曲线及循环伏安曲线)和表面分析方法(SEM和原位Raman光谱)研究了空冷20SiMn钢在pH值均为10.64的3种浓度的碳酸盐缓冲液和浓度恒定为0.437×10-3mol/L的NaOH溶液中的腐蚀行为.结果表明,20SiMn钢在NaOH溶液中发生了均匀腐蚀,经Fe(OH)2转变为最终产物a-Fe2O3和γ-FeOOH;在低浓度碳酸盐缓冲液中发生了局部腐蚀,经绿锈GRs得到最终腐蚀产物α-Fe2O3和β-FeOOH;在高浓度碳酸盐缓冲液中发生了钝化,并且受可溶性离子Fe(CO3)22-的影响,钝化膜的耐蚀性随碳酸盐总浓度的升高存在极值.
参考文献
[1] | Ahmd S.Cem Concr Compos,2003; 25:459 |
[2] | Biezma M V,San Cristobal J R.Corros Eng Sci Technol,2005; 40:344 |
[3] | Page C L,Treadaway K W J.Nature,1982; 297:109 |
[4] | Page C L,Ngala V T,Page M M.Mag Concr Res,2000; 52:25 |
[5] | Gaidis J M.Cem Concr Compos,2004; 26:181 |
[6] | Dantan N,H(o)hse M,Karasyov A A,Wolfbeis O S.Tm-Technisches Messen,2007; 74:211 |
[7] | Singh D D N,hosh R G.Surf Coat Technol,2006; 201:90 |
[8] | Xu H,Liu Y,Chen W,Du R G,Lin C J.Electrochim Acta,2009;54:4067 |
[9] | Xue H B,Cheng Y F.JMEPEG,2010; 19:1311 |
[10] | Fu A Q,Cheng Y F.Corros Sci,2010; 52:612 |
[11] | Li J B,Zuo J E.Chin J Chem,2008; 26:1799 |
[12] | Rangel C M,Fonseca I T,Lei(a)o RA.Electrochim Acta,1986; 31:1659 |
[13] | Rangel C M,Lei(a)o RA.ElectrochimActa,1989; 34:255 |
[14] | Thomas J G N,Nurse T J,Walker R.Br Corros J,1970; 5:85 |
[15] | Huet B,L'Hostis V,Miserque F,Idrissi H.Electrochim Acta,2005; 51:172 |
[16] | Valentini C R,Moina C A.Corros Sci,1985; 25:985 |
[17] | Davies D H,Burstein G T.Corrosion,1980; 36:416 |
[18] | Dong J H,Nishimura T,Kodama T.Mater Res Soc Syup Proc,2002; 713:85 |
[19] | Nieuwoudt M K,Comins J D,Cukrowski I.Raman Spectrosc J,,2011; 42:1335 |
[20] | Lee C T,Odziemkowski M S,Shoesmith D W.JElectrochem Soc,2006; 153:33 |
[21] | Nieuwoudt M K,Comins J D,Cukrowski I.Raman Spectroscopy,doi:10.1002/jrs.2837 |
[22] | Fajardo G,Valdez P,Pacheco J.Constr Build Mater,2009; 23:768 |
[23] | Morrison S R.Electrochemistry at Semiconductor and Oxidized Metal Electrodes.New York:Plenum Press,1980:316 |
[24] | Li D G,Feng Y R,Bai Z Q,Zhua J W,Zheng M S.Electrochim Acta,2007; 52:7877 |
[25] | Castro E B,Valentini C R,Moina C A,Vilche J R,Arvia A J.Corros Sci,1986; 26:781 |
[26] | Schrebler Guzmán R S,Vilche J R,Arvia A J.Electrochim Acta 1979; 24:395 |
[27] | Reffass M,Sabot R,Savall C,Jeannin M,Creus J.Refait P.Corros Sci,2006; 48:709 |
上一张
下一张
上一张
下一张
计量
- 下载量()
- 访问量()
文章评分
- 您的评分:
-
10%
-
20%
-
30%
-
40%
-
50%