采用熔融冷却法制备了系列不同Ho3+离子掺杂浓度的Ge-Ga-S-CsI玻璃样品，测试了样品的折射率、吸收光谱以及中红外荧光光谱和Ho3+离子5I6能级荧光寿命.应用Judd-Ofelt理论计算了Ho3+离子在该基质玻璃中强度参数Ωi（i=2,4,6）、能级跃迁振子强度fcal、自发跃迁几率Arad等光谱参数.计算了Ho3+∶5I5→5I6 (3.86μm)和5I6→5I7 (2.81μm)跃迁的多声子驰豫速率.讨论了中红外荧光特性与Ho3+离子掺杂浓度之间的关系.结果表明，在900nm 激光泵浦下观察到了2.81和3.86μm两处中红外荧光，分别对应于Ho3+∶5I6→5I7 和5I5→5I6 跃迁，当Ho3+离子掺杂浓度从0.5wt%增加到1.0wt%时，两处中红外荧光强度都随相应增加，计算的Ho3+∶5I5→5I6 和5I6→5I7 跃迁多声子驰豫速率分别为29s-1和34s-1.
A serial of chalcogenide glasses based on Ge-Ga-S-CsI system doped with the different Ho3+ ions were synthesized by meltquenching technique. The properties of glasses including refractive indexes, absorption spectra, midinfrared emission spectra and lifetimes of 5I6 level of Ho3+ ions were measured. The Judd Ofelt intensity parameters Ωi (i=2,4,6), oscillator strength fcal, spontaneous transition probabilities Arad for Ho3+ ion were calculated by Judd-Ofelt theory. Multiphonon relaxation rates of the Ho3+∶5I5→5I6 and 5I6→5I7 in Ge-Ga-S-CsI glasses were evaluated. Effect of Ho3+ ion concentration on the fluorescence spectra was investigated. The results indicate that the fluorescence under 900 nm excitation with peak wavelength at 2.81μm and 3.86μm are due to the Ho3+∶5I5→5I6 and 5I6→5I7 transition, respectively. The intensity of the mid-infrared fluorescence are enhanced with the Ho3+ ion concentration increasing from 0.5wt% to 1.0wt%. Multiphonon relaxation rates are 29s-1 and 34s-1 for the Ho3+∶5I5→5I6 and 5I6→5I7 transition, respectively.
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