采用熔体冷却的方法制备了SnO-CaO-P2O5三元体系无铅玻璃. 采用X射线衍射仪、热膨胀仪、绝缘电阻测试仪和粉末失重法研究了该体系玻璃的玻璃形成区、热膨胀系数、体积电阻率及化学稳定性. 结果表明, 样品体积电阻率随P2O5含量的增加先增大后减小, 在P2O5=50mol%附近出现极大值, 随SnO含量的增加逐渐减小. 对10SnO-40CaO-50P2O5-xSiO2系列试样的研究表明, 随着SiO2含量的增加, 样品热膨胀系数由9.8×10-6/℃逐渐减小至7.6×10-6/℃, 体积电阻率逐渐增大, 在酸性和中性溶液中失重率逐渐减小, 在碱性溶液中失重率则逐渐增大.
Lead-free glass in SnO-CaO-P2O5 ternary system were fabricated by melt quenching method. The glass-forming region, coefficient of thermal expansion (CTE), volume resistivity as well as chemical durability of the glass were investigated by the methods of X-ray diffractometer, thermal expansion instrument, insulation resistance instrument, and grain mass loss method. The results show that the glass-forming region is larger than that of SnO-ZnO-P2O5 ternary system. The minimum content of P2O5 to form glass phase should be 25mol%, while it increases rapidly to about 40mol% with the increase of CaO amount. Softening temperature (about 445℃) and CTE (9.0×10?6-10.0×10-6/℃) of the glass are equivalent with those of Pb-based sealing glass. The volume resistivity presents a maximum at about 50mol% P2O5 content with the increase of P2O5 amount, while it decreases with the increase of SnO amount. Research on the samples of 10SnO-40CaO-50P2O5-xSiO2 system show that with the increase of SiO2 amount, the CTE decreases from 9.8×10-6/℃ to 7.6×10-6/℃ and the volume resistivity increases gradually, while the mass loss decreases gradually in acid and neutral condition and increases in basic condition.
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