通过溶胶-凝胶法,制备了银/二氧化硅核壳材料(Ag@SiO2),对SiO2壳层厚度进行了有效调控,并系统研究了壳层厚度对银的等离子体共振峰(LSPR)以及对折射率灵敏度(RIS)的影响.研究结果表明,随SiO2壳层包覆厚度的增加,银纳米颗粒的LSPR吸收峰呈现先红移后蓝移的规律.对于粒径为50 nm的银纳米颗粒,当SiO2壳层达到65nm时,LSPR最大吸收波长为465nm.进一步增加SiO2壳层厚度,LSPR发生蓝移并且强度变弱,当SiO2壳层达到120nm时,LSPR吸收峰已无法清晰辨认.研究了Ag@SiO2材料的RIS效应,发现随着SiO2厚度的增大RIS效应逐渐变小.
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