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利用输出信号波形及偏压测试方法对TFT-LCD产品关机过程中发生的横纹不良进行了分析.分析结果表明,不良与像素电极放电效率相关.在此基础上提出了两种改善方法:一是通过改善TFT特性提高电极充放电能力;二是通过添加reset驱动电路实现像素电极同时放电.试验结果表明,放电效率的提升对于改善横纹缺陷效果明显,其中后者可完全消除不良现象.

The horizontal block stripe,as an image quality defect,was analyzed by means of output signals and bias voltage stress (BVS) test.The results showed that the defect was correlated with discharging efficiency.Further,two approaches were proposed,one was to improve TFT characteristic,the other was to add reset function.The combined experiments indicated that discharging promotion can improve the defect.Especially the latter is most optimal to eliminate the phenomenon.

参考文献

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[2] Hong Sunkwang,Oh Jaeho,Park Poyun,et al.Enhancement of motion image quality in LCDs[C]//SID'04 Symposium Digest,San Jose,USA:SID,2004:1353-1355.
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[5] Miwa K,Maekawa Y,Tsujimura T.Vth shift overcompensation in AMOLEDs for differential aging compensation[C]//SID'09 Symposium Digest,Texas,USA:SID,2009:1148-1151.
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