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采用射频磁控溅射法在玻璃基片上制备了NdTbCo/Cr非晶垂直磁化膜.探讨了溅射功率与溅射时间对薄膜磁性能的影响,发现当溅射功率为250 W,溅射时间为4 min时,垂直膜面方向矫顽力为272.8 kA·m-1,剩磁矩形比达到0.801,可以较好地满足高密度垂直磁记录的要求.研究了 Nd掺杂对薄膜磁性能与磁光性能的影响,发现随着Nd掺杂量的增多,薄膜的矫顽力从413.8下降为210.9 kA·m-1,饱和磁化强度与克尔旋转角则分别从144 kA·m-1和0.2720°上升为252 kA·m-1和0.3258°.温度对NdTbCo/Cr薄膜克尔旋转角的影响也与Nd的掺杂量密切相关.

参考文献

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