研究建立了ICP-AES同时测定磁制冷材料钆硅锗系合金中Mo,Mn,Al,V,Ni,Cu,Ga,Fe,Ca(含量范围为质鼍分数0.1%～1%)9种杂质元素的分析方法.方法的检出限为0.003～0.1 μg·ml-1,测定下限为0.02～0.5μg·ml-1,回收率在94%～108%,对于杂质质量分数为0.1%,0.5%,1.0%的样品,其RSD分别为0.40%～2.6%,0.52%～1.1%,0.67%～1.3%,结果表明该方法的精密度和准确度均满足微最分析的要求.
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