采用脉冲激光技术在Pt/Ti/SiO2/Si衬底上沉积了非晶La2O3薄膜,制作并分析了Pt/La2 O3/Pt堆栈层的直流电压与脉冲电压诱导的电阻转变特性.Pt/La2O3/Pt器件单元表现出了稳定的双极性电阻转变,其高低阻态比大于两个数量级.经过大于1.8×106s的读电压,高低阻态的电阻值没有明显的变化,表现出了良好的数据保持能力.通过研究高低阻态的电流电压关系、电阻值与器件面积的关系,揭示了导电细丝的形成和破灭机制是导致Pt/La2O3/Pt器件发生电阻转变现象的主要原因.
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