测量了欠掺杂区域Sm2-xCexCuO4(0.09≤x≤0.15)多晶样品的热电势S和电阻率ρ的温度依赖关系.电阻率ρ在低于200K处斜率发生改变,表明低温下发生载流子弱局域化.热电势S高温下满足线性温度依赖关系,随着温度降低,在200～250K发生斜率改变,可以用赝能隙的开放解释.所有的样品在50K观察到一个曳引峰,表明载流子符号发生改变,由电子型转变为空穴型.
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