本文通过实验研究了拉伸应变对YBCO涂层导体的临界电流(Ic)、n值和交流损耗的影响(零场,77K),实验结果表明,随着拉伸应变的增大,YBCO涂层导体Ic的变化分为三个阶段,开始缓慢上升,然后缓慢下降,最后快速下降,Ic的上升表明带材中存在残余压缩应变,Ic的衰减是由于应变导致弱连接区域的钉扎势与晶界间临界电流密度同时减小引起的;而n值随应变增加基本上没有变化,说明沿导体长度方向的Ic分布没有变化.由于临界电流密度沿样品宽度方向分布不均匀,实验所得的交流损耗结果与采用Norris模型计算所得的结果不一致,同时,当应变超过不可逆应变、电流接近Ic时,交流损耗快速增加.
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