本文通过化学溶液法在双轴织构的金属Ni-W衬底上外延生长了CeO2超导涂层导体缓冲层薄膜.X衍射极图表明其面内外织构良好.扫描电子显微镜和原子力显微镜观察薄膜表面光滑、平整且粗糙度低.采用差热分析研究了升温速率及样品质量对前驱溶液热反应过程的影响,结果表明其热反应主要经历了三个过程,其中吸附水的脱去和醋酸组的解离分别发生在110～140℃与230～240℃两个温度范围内,且受升温速率的影响很小,表明这两个反应都在较短的时间内完成.而发生在250～500℃温度段的氧化合成反应则需要较长的时间,其反应结束温度与升温速率近似成线性增加.X衍射分析进一步证实了上述三个热反应过程,当温度达到700℃时CeO2可以得到完好的结晶.
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