厚度为6～100 nm的(La0.6Nd0.4)0.7,Sr0.3MnO3(LNSMO)薄膜是由脉冲激光沉积生长在SrTiO3[STO(001)]衬底上.X-射线衍射(XRD)线扫描、ω-摇摆曲线和倒空间衍射显示,随着膜厚(t)的变化,薄膜的结构经历了由完全应变到部分弛豫的变化.电阻测量显示存在两个不同的厚度依赖的金属-绝缘体转变温度(Tp),对于应变的薄膜(t≤17 nm),Tp敏感地依赖于双轴应变和膜厚；而对较厚的薄膜(t≥35nm),Tp对于膜厚是较小敏感的.这个厚度依 赖的输运性的变化可被解释为菱形LNSMO的角度畸变诱导的应变和弛豫.我们的结果表明金属-绝缘体转变温度和相分离都受薄膜的应变态控制.
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