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利用自组装成膜技术在磺酸化的MPTS自组装单层薄膜表面制备了ZrO2薄膜,应用接触角测定仪、X射线光电子能谱仪(XPS)、原子力显微镜(AFM)分析了薄膜的组成和结构.结果表明:该ZrO2薄膜比较致密、无裂缝,呈"准二维"特征,且与基底的牢固性好.摩擦磨损试验表明:ZrO2薄膜经500℃烧结处理后适于在低负荷、低滑动速度下作为减摩、抗磨保护性涂层.

参考文献

[1] 徐冉;李薇;席时权 .Ag2O胶体粒子的自组装单层膜和多层膜[J].光散射学报,1999,11(02):151.
[2] Huang D.;Gu JH.;Huang NP.;Yuan CW.;Xiao ZD. .TIO2 THIN FILMS FORMATION ON INDUSTRIAL GLASS THROUGH SELF-ASSEMBLY PROCESSING[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,1997(1/2):110-115.
[3] Bunker B C;Rieke P C;Tarasevich B J et al.Ceramic thinfilm formation on functionalized interfaces through biomimetic processing[J].Science,1994,264:48.
[4] Lee JS.;Sei T.;Tsuchiya T.;Matsubara T. .PREPARATION AND PROPERTIES OF Y2O3-DOPED ZRO2 THIN FILMS BY THE SOL-GEL PROCESS[J].Journal of Materials Science,1997(19):5249-5256.
[5] A. Fischer;F.C. Jentoft;G. Weinberg .Characterization of thin films containing zirconium, oxygen, and sulfur by scanning electron and atomic force microscopy[J].Journal of Materials Research,1999(9):3725-3733.
[6] Paterson MJ.;Ben-Nissan B.;Paterson PJK. .The dependence of structural and mechanical properties on film thickness in sol-gel zirconia films[J].Journal of Materials Research,1998(2):388-395.
[7] Moulzolf S C;Lad R J;Blau P J .Properties of ZrO2 films on sapphire prepared by electron cyclotron resonance oxygen-plasma-assisted deposition[J].Thin Solid Films,1999,347:220.
[8] Balachander N;Sukenik C N .Monolayer transformation by nucleophilic substitution:Application to the creation of new monolayer assemblies[J].Langmuir,1990,6:1621.
[9] Wu JH.;Mate CM. .Contact angle measurements of lubricated silicon wafers and hydrogenated carbon overcoats[J].Langmuir: The ACS Journal of Surfaces and Colloids,1998(17):4929-4934.
[10] Brenier R.;Mirica E.;Mugnier J. .XPS study of amorphous zirconium oxide films prepared by sol-gel[J].Applied Surface Science: A Journal Devoted to the Properties of Interfaces in Relation to the Synthesis and Behaviour of Materials,1999(1):85-91.
[11] Ritley K A;Just K P;Schreiber F et al.X-ray reflectivity study of solution-deposited ZrO2 thin films on self-assembled monolayer:growth,interface properties,and thermal densification[J].Journal of Materials Research,2000,15:2706.
[12] Polli AD.;Fischer A.;Weinberg G.;Jentoft FC.;Schlogl R. Ruhle M.;Wagner T. .Structural characterization of ZrO2 thin films produced via self-assembled monolayer-mediated deposition from aqueous dispersions[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2000(1/2):122-127.
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