本文首次采用透射电子显微术系统地研究了由FeNi触媒制备的金刚石单晶的微观结构，分析了人造金刚石中存在的晶体缺陷，探讨了这些晶体缺陷形成的原因。研究发现金刚石中存在层错、棱柱位错、位错列和位错网络等晶体缺陷。研究结果表明，金刚石中的晶体缺陷与金刚石的高温高压合成过程密不可分，主要起源于金刚石中大量过饱和的空位和微观杂质所引起的内应力。
Transmisson electron microscopy (TEM) has been used to investigate the microstructures and analyze the defects in synthetic diamond prepared under high temperature-high pressure in the presence of FeNi alloy catalyst.It was found that there exist prismatic dislocations,stacking faults,array of dislocations and dislocation network.The formation mechanism of these defects was studied.Results show that defects in the diamond were closely related to high temperature-high pressure synthesis process and originated mainly from excess amount of saturated vacancies and internal stress generated by micro-inclusions.
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