浓度边界层是晶体生长过程中分析界面输运现象的重要元素.我们从实验角度研究了扩散机制下的BaB2O4单晶生长中过饱和温度和降温速率对浓度边界层厚度的影响.过饱和温度和浓度边界层厚度之间为抛物线关系,降温速率和浓度边界层厚度变化率之间为线性关系.
参考文献
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