本文研究了大尺寸、高光学质量无机闪烁晶体Ce3+:YAG的生长,并对它的吸收光谱和荧光光谱进行了测量和分析.在克服了晶体易开裂和出现宏观缺陷的情况下,采用提拉法成功生长出直径达45mm的Ce3+:YAG单晶.光谱测量表明晶体具有优良的光学性能.并已经在大规模集成电路的检测上得到应用.
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