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本文报道了在廉价的颗粒硅带上用PECVD法并两次引入铝的工艺制备多晶硅薄膜.第一次引入铝是为了去除薄膜上过多的杂质;第二次引入铝是为了实现低温诱导结晶.通过对薄膜样品的拉曼谱和X射线衍射(XRD)谱分析,我们认为金属低温诱导结晶成功与否跟诱导前薄膜的结构密切相关.采用该工艺成功地制备了结晶度92%左右、可应用于太阳能电池的高纯优质多晶硅薄膜.

参考文献

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