本文对温度梯度法生长的氟化钙(CaF2)晶体中的包裹物进行了研究,用光学显微镜和SEM观察了包裹物的形貌,对晶体中的包裹物和透明部分作了微区EDX成分分析,对包裹物所含的杂质进行了解释,提出了减小或消除包裹物的措施.分析结果表明:包裹物的主要成分是碳和氧,碳来源于石墨坩埚和石墨发热体,而杂质氧则来源于原料中的含氧化合物和生长过程气氛中氧的进入.
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