用RF磁控溅射方法,在高功率下制备厚度为2μm的薄膜,当N含量在5.9～8.5%原子分数范围内,形成α′+α″相时,4πMs=2.2T,Hc=58.6A/m,可以满足针对高存储密度的GMR/感应式复合读写磁头中写入磁头的需要.用该方法在不同的本底真空度下制备Fe-N薄膜,发现较高真空下比较低真空下制备的Fe-N薄膜磁学性能要好.P=1000W时,较高真空下制备的Fe-N薄膜的矫顽力为34.8A/m,较低真空下制备的Fe-N薄膜的矫顽力为58.6A/m.AFM测试表明,在功率条件相同情况下,较高真空下制备的Fe-N薄膜表面光滑、平整、起伏小、薄膜致密;而较低真空下制备的Fe-N薄膜,表面粗糙、起伏大、薄膜较疏松、不均匀.
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