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利用透射偏光显微术、同步辐射X射线形貌术、高分辨X射线衍射方法对6H-SiC(0001)晶片中的微管和小角度晶界等缺陷进行了研究.实验发现,在透射偏光显微镜下,微管通常呈现为蝴蝶形,这是由于微管周围存在着应力场,且应力分布不均匀,当线偏振光在通过微管周围区域时传播速度不同造成的.从X射线背反射同步辐射形貌像得到晶片中微管的Burgers矢量大小在2c到10c之间.从晶片00012衍射的双晶衍射摇摆曲线可以看出,晶片的中间大部分区域质量很好,双晶衍射峰为单峰且半峰宽很窄,一般为35"左右.在外围区域双晶衍射峰的半峰宽变宽,有些区域还会出现衍射峰的分裂,这说明外围区域有嵌镶块结构存在.

参考文献

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