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氢化非晶硅薄膜具有优异的光电特性,在制备薄膜太阳能电池中有重要的应用.本文采用热丝辅助MWECR CVD技术,通过调整各种工艺参数,制备了高沉积速率(DR>2.5nm/s)及高光敏性(σph/σD>105)的氢化非晶硅薄膜.实验表明,在衬底表面温度的分布中,热丝辐射和离子轰击引起的温度对薄膜的光敏性影响较大;在薄膜沉积的最后几分钟适当加大H2稀释率,有利于薄膜光电特性的改善.

The hydrogenated amorphous silicon (a-Si:H)manufactured by plasma deposition techniques has been extensively investigated as a low-cost material used for solar cells production, during which its photovoltaic properties are strongly dependent on the H content and various H-Si bonding configurations closely related to the experiment parameters. In this study, samples are deposited using microwave electron cyclotron resonance chemical vapor deposition ( MW ECR CVD ) system assisted by hot filament. The parameters are adjusted to improve the deposition rate (DR) and photosensitivity ( σph/σD ) of a-Si:H thin films and infrared spectroscopy is utilized to determine the H content and H-Si configuration. It is suggested that in this system, the higher temperature caused by the energetic bombardment of ions and radiation of hot filament is, the higher value of σph/σD is obtained, and meanwhile the photo-electric properties of a-Si: H films are improved by chemical etching of weak Si-Si bonds when the H2 dilution ratio is increased for the last few minutes during the film deposition.

参考文献

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