本文研究了不同掺Ti3+浓度对温梯法生长的Ti:Al2O3晶体吸收光谱、荧光光谱和X射线衍射光谱的影响.根据吸收光谱提出了一个色心模型.对比了样品各处420nm荧光谱,发现掺Ti3+浓度越大,该处荧光强度越弱,同时解释了420nm处荧光峰的起源.对比了样品各处720nm处的荧光谱,发现掺Ti3+浓度越大,该处荧光强度越强.X射线衍射谱(XRD)表明,衍射峰强度随掺Ti3+浓度的增大而逐渐增强.
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