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采用循环伏安曲线以及稳态极化曲线的测试方法分析了二甲基亚砜有机溶液中纯Bi、纯Sb以及Bi-Sb二元体系在Ti基体上的还原过程.结合分析结果,采用直流恒电位方式电沉积制备了Bi-Sb二元薄膜温差电材料,并采用X-射线衍射以及塞贝克系数测试对不同电位下制备出的Bi-Sb二元薄膜温差电材料的物相结构及性能进行了表征.实验结果表明,在Ti基体上Bi3+、Sb3+离子的氧化还原均为不可逆过程,前者的阴极还原过程仅由离子扩散造成,而后者的还原过程中涉及到了离子的吸附,二者沉积电位接近,共沉积过程是一步完成的.对制备出的材料的物相以及性能的分析结果表明,电沉积制备出的材料确为Bi-Sb二元合金,随着沉积电位的负移,温差薄膜电材料的表面变得粗糙,在不同电位下沉积出的材料均为P型温差电材料,塞贝克系数随电位变化不大.

参考文献

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