用透射电镜、X射线衍射分析研究了Fe-17Mn-10Cr-5Si-4Ni 合金应力诱发εM的组成状态在室温随应力水平的提高而产生的变化.在应变小于3%所对应的低应力水平下,形成εM单变体薄片,其厚度小于10nm;而在对应应变超过3%的较高应力水平下形成了长尺寸的εM ,其组成结构特点是单变体薄片单元沿长度方向排列.而宽大εM内部组成结构状态的复杂性则与这种单变体薄片单元的排列组合有关.
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