制备了具有择优取向的粘结Ni52Mn24.4Ga23.6磁体,测量了其在不同温度下的磁诱发应变,并就测试温度对磁诱发应变的影响进行了探讨.结果表明:粘结磁体室温时在1.2T磁场下磁诱发应变能达到饱和,为150×10-6的伸长应变;零摄氏度时磁体则在0.6T的磁场下产生76×10-6的饱和收缩应变;零摄氏度时磁诱发应变的可逆性要明显好于室温时应变的可逆性.XRD分析表明,造成不同测试温度下粘结磁体磁诱发应变行为不同的原因可能是不同温度下合金晶体结构有所不同.
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