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采用Ti-Zr-Ni-Cu钎料对ZrB2-SiC陶瓷的真空钎焊工艺进行研究.借助SEM,EDS和XRD等分析测试手段,分析了接头的界面组织结构及性能.实验结果表明:接头界面产物主要有TiC,ZrC,Ti5Si3,Zr2Si,Zr(s,s),(Ti,Zr)(Ni,Cu)等.随着钎焊温度和钎焊保温时间的增加,钎焊接头中的Zr(s,s)层厚度不断增加,焊缝两侧灰色相Ti5Si3+Zr2Si的体积和数量逐渐增加并向焊缝中部生长伸展,焊缝接头中的黑色相TiC+ZrC的体积和数量明显增加,其分布贯穿整个焊缝.当钎焊温度为920℃,钎焊时间为10min时,钎焊接头的抗剪切强度最高,达到143.5MPa.

参考文献

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