本工作采用溶胶-凝胶提拉法制备了SUS430合金连接体LSCM涂层,探索了涂层的制备工艺,并采用X-ray衍射对涂层进行了分析.通过对涂层X-ray衍射谱的Rietveld拟合,确定了LSCM涂层的精细晶体结构；基于Rietveld拟合得到的洛伦兹峰形展宽参数,计算得到涂层的平均晶粒尺寸；以合金基体相峰形展宽为参照,基于Rietveld拟合和微观应变峰形展宽理论计算得到涂层晶粒内部最大微观应变的方向和大小,分析了涂层中微观应力存在的可能原因.
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