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利用等离子体发射光谱监测系统(PEM)控制钒的等离子强度,在石英基底上磁控溅射制备了VO2薄膜。采用 XRD、XPS、SEM、紫外-可见-近红外分光光度计及傅立叶红外分光光度计研究薄膜的结构、光学及相变特性。结果表明,所制备的 VO2薄膜具有(011)取向,VO2薄膜的热滞回线宽度为25℃,可见光透过率和太阳光调节率分别可达T lum,l=34.1%、T lum,h=35.3%和ΔT sol=6.8%,相变前后,红外光区的反射率变化最大值可达44.4%。

Vanadium dioxide (VO2 )thin film was deposited on quartz glass by magnetron sputtering.The plas-ma emission monitoring (PEM)was used to control the plasma emission intensity of vanadium during the ex-periment.Investigations on the structure,optical properties and phase transition performance of the films using XRD,XPS,SEM,UV-Vis-NIR spectrophotometer and Fourier infrared spectrophotometer.The results show that the VO2 films have the (011)orientation,with the width of the hysteresis loop was 25℃.A sample with balanced luminous transmittance (Tlum)and switching efficiency (ΔTsol)of the films are about 34.1% (20℃) and 35.3 %(90℃),and 6.8%(ΔTsol),respectively.At the phase transition process,the maximum variation of reflectance in infrared regions up to 44.4%.

参考文献

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