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调节磁控溅射工艺中氧气的含量,在玻璃基片上制备了ITO 薄膜.研究氧气含量对 ITO 薄膜光学、电学性能的影响,以及在高温、高温高湿、碱性环境及经时的电学性能的稳定性.结果表明,氧气含量的增加会降低沉积速率;氧气含量对 ITO 薄膜在可见光区内的透光率影响较小,但会引起峰值透光率蓝移;对电学性能及其稳定性影响较大,氧气含量在1%(体积分数)以内时,电学性能呈先降低后升高的变化,在0.4%(体积分数)时具有较低的电阻率,且在各种环境中具有较高的稳定性;氧气含量高于1%(体积分数),电学性能及其稳定性变差.

ITO films under different oxygen content were deposited by magnetron sputtering on glass substrates. The effects of oxygen content on the optical,electrical properties as well as stability of ITO films under high temperature,high temperature and high humidity,alkaline environments and time-dependent are studied.The results show that the increasing of oxygen content reduces the deposition rate.The oxygen content has a little influence on the visible transmittance,and causes the blue shift of peak transmittance.However,the oxygen content has a great impact on the electrical property and stability.When the oxygen content was less than 1vol%,the electrical property firstly decrease and then increase,and the optimal resistivity was achieved at 0.4 vol% oxygen content.Furthermore,the electrical property has high stability in various environments.When the oxygen content exceeds 1 vol%,the electrical properties and its stability are deteriorated.

参考文献

[1] Mika Yamaguchi;Ari Ide-Ektessabi;Hiroshi Nomura;Nobuto Yasui .Characteristics of indium tin oxide thin films prepared using electron beam evaporation[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2004(1):115-118.
[2] E. Holmelund;B. Thestrup;J. Schou;N.B. Larsen;M.M. Nielsen;E. Johnson;S. Tougaard .Deposition and characterization of ITO films produced by laser ablation at 355 nm[J].Applied physics, A. Materials science & processing,2002(2):147-152.
[3] Kurdesau F;Khripunov G;da Cunha AF;Kaelin M;Tiwari AN .Comparative study of ITO layers deposited by DC and RF magnetron sputtering at room temperature[J].Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites,2006(9/20):1466-1470.
[4] C. May;J. Strumpfel .ITO coating by reactive magnetron sputtering-comparison of properties from DC and MF processing[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,1999(1/2):48-52.
[5] S.M. Rozati;T. Ganj .Transparent conductive Sn-doped indium oxide thin films deposited by spray pyrolysis technique[J].Renewable energy,2004(10):1671-1676.
[6] Kor?si, L.;Papp, S.;Beke, S.;Pécz, B.;Horváth, R.;Petrik, P.;Agócs, E.;Dékány, I. .Highly transparent ITO thin films on photosensitive glass: Sol-gel synthesis, structure, morphology and optical properties[J].Applied physics. A, Materials science & processing,2012(2):385-392.
[7] Jae-Hyung Kim;Joon-Hyung Lee;Young-Woo Heo;Jeong-Joo Kim;Ju-O Park .Effects of oxygen partial pressure on the preferential orientation and surface morphology of ITO films grown by RF magnetron sputtering[J].Journal of electroceramics,2009(2/4):169-174.
[8] Bo Zhang;Xianping Dong;Xiaofeng Xu .Preparation and characterization of tantalum-doped indium tin oxide films deposited by magnetron sputtering[J].Scripta materialia,2008(3):203-206.
[9] Minami T.;Takata S.;Kakumu T.;Takeda Y. .PREPARATION OF TRANSPARENT CONDUCTING IN4SN3O12 THIN FILMS BY DC MAGNETRON SPUTTERING[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,1997(0):13-18.
[10] Wu W F;Chiou B S;Hsieh S T .Effect of sputtering power on the structural and optical properties of RF magnetron sputtered ITO films[J].Semicond Sci Techn-ol,1994,9:1242-1249.
[11] C. Nunes de Carvalho;A. M. Botelho do Rego;A. Amaral;P. Brogueira;G. Lavareda .Effect of substrate temperature on the surface structure, composition and morphology of indium-tin oxide films[J].Surface & Coatings Technology,2000(1):70-75.
[12] Sun, K.;Zhou, W.;Tang, X.;Huang, Z.;Luo, F.;Zhu, D. .Effects of air annealing on the structure, resistivity, infrared emissivity and transmission of indium tin oxide films[J].Surface & Coatings Technology,2012(19/20):4095-4098.
[13] Reddy, I N1;Reddy, V R2;Sridhara, N1;Rajendra, A1;Rao, V S1;Dey, A1;Sharma, A K1 .Development and environmental stability of ITO thin film for spacecraft application[J].Materials research innovations,2013(1):22-26.
[14] Lim C Y;Park J K;Kim Y H et al.Mechanical and electrical stability indium-tin-oxide coated polymer sub-strates under continuous bending stress condition[J].JI-CEE,2012,2:237-241.
[15] Chung-Soo Kim;Sang-Mok Lee;Sang-Kooun Jung .Stability of ITO Films with Oxide Buffer Layer Grown onto PES Substrates[J].Molecular crystals and liquid crystals,2009(TN.499):311-315.
[16] Hamasha, M. M. .Stability of ITO Thin Film on Flexible Substrate Under Thermal Aging and Thermal Cycling Conditions[J].Journal of display technology,2012(7):383-388.
[17] Guillen C;Herrero J .Stability of sputtered ITO thin films to the damp-heat test[J].Surface & Coatings Technology,2006(1/2):309-312.
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