采用固相反应法合成了含有铜锌锡硫相的纳米粉体材料;利用X射线荧光光谱仪、X射线衍射仪(XRD)、显微拉曼光谱仪对样品的组成比和相结构进行表征,利用透射电子显微镜和紫外-可见-近红外分光光度计对样品的形貌和光学性能进行表征分析.结果表明,所得样品的XRD衍射峰与JCPDS卡片号为26-0575的峰值一一对应,证明了在不同烧结温度下制成的样品中均含有铜锌锡硫相,在烧结温度高于500 ℃时,制得样品为纯的铜锌锡硫相.所得样品的衍射峰强度以及晶粒尺寸受烧结温度的影响,样品的原子比Cu/(Zn+Sn)接近1,符合材料的化学计量组成的要求,而且薄膜的略微富铜或贫铜与烧结温度无关,主要由实验的随机误差造成.各样品的Zn/Sn值均约等于1,随烧结温度升高呈下降趋势.所制得铜锌锡硫对可见光有明显的吸收,利用外延法推算得到禁带宽度约为1.51 eV.该材料可用来压制铜锌锡硫靶材,为磁控溅射铜锌锡硫薄膜奠定基础.
Cu2ZnSnS4 nano powder materials were prepared by the solid state reaction method.The composition ratios and phase structures of the powder samples were characterized by Xray fluorescence spectrometer, Xray diffraction (XRD) and micro Raman spectroscopy, the morphology and optical properties were characterized by TEM and UV-VisNIR spectrophotometer. He results show that the XRD diffraction peaks of the samples are onetoone correspondence to the peaks of the JCPDS card 260575, which proves that the samples contain CZTS phase at different sintering temperatures. It shows a pure CZTS phase while the sintering temperature is above 500 ℃ . The diffraction intensity and the grain size of CZTS owders re affected by the sintering tempera ture. The atomic ratios Cu/(Zn+Sn) are close to l, consistent with the stoichiometric composition. Besides, it has nothing to do with the sintering temperature that the sample is copper rich or poor copper, which is mainly caused by the random error of the experiment. The atomic ratios Zn/Sn are approximately qual to l, and the Zn/Sn values decrease with the increase of the sintering temperature. Besides,Asobtained CZTS powders have obvious absorption in the visible region, and the band gap was derived by extension method , is about l.51 eV.This material can be used to suppress the CZTS target , which lays the foundation for depositing the CZTS filmby agnetron sputtering technique.
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