利用基片曲率法原理,设计改装了一套基片曲率显微观测装置用于测量稀土超磁致伸缩合金非晶RGMF薄膜试样的曲率半径并计算薄膜应力;分析探讨了使用该装置测量计算曲率半径的随机误差与系统误差,并在此基础上进一步分析了薄膜应力的相对误差.利用该装置测量了采用离子束溅射沉积法在青铜基片上沉积TbDy-Fe非晶薄膜的应力大小为150MPa,为压应力,测量总误差在8%以内.
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